Method and apparatus for non-contact electrical probe

Details Method and apparatus for non-contact electrical probe Method and apparatus for non-contact electrical probe

2007-03-27

2007-03-27

Nguyen, Vinh (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S1540PB, C324S701000, C438S017000, C250S492200

Reexamination Certificate

active

10910060

ABSTRACT:
Methods and apparatus for non-contact electrical probes are described. In accordance with the invention, non-contact electrical probes use negative or positive corona discharge. Non-contact electrical probes are suited for testing of OLED flat panel displays.

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