Method and apparatus for nanometer-scale focusing and...

Radiant energy – Ion generation – Field ionization type

Reexamination Certificate

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C250S42300F, C250S424000, C250S3960ML

Reexamination Certificate

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06852985

ABSTRACT:
Methods and apparatus for focusing proton and ion beams within the profile of the beam envelope of an ultra-low emittance, charge neutralized emission to create a pattern without focusing the entire beam envelope or rastering. In one implementation, a method for use with laser accelerated ion beams comprises the steps: irradiating a surface of a target with pulsed laser irradiation to produce an electron plasma emission on a non-irradiated surface of the target, the electron plasma emission producing an ion beam emission on the non-irradiated surface, the ion beam emission having a beam envelope; and focusing ions of the ion beam emission into a plurality of component beams within the beam envelope as a result of the shape of the non-irradiated surface of the target.

REFERENCES:
patent: 4597933 (1986-07-01), Ripin et al.
patent: 4664769 (1987-05-01), Cuomo et al.
Hatchett et al.,Electron, Photon, And Ion Beams From The Relativistic Interaction Of Petawatt Laser Pulses With Solid Targets,Physics of Plasmas, May 2000, pp. 2076-2082, vol. 7, No. 5, American Institute of Physics.
Murakami et al.,Observation Of Proton Rear Emission And Possible Gigagauss Scale Magnetic Fields From Ultra-Intense Laser Illuminated Plastic Target,Physics of Plasmas, Sep. 2001, pp. 4138-4143, vol. 8, No. 9, American Institute of Physics.
Wilks, S.C. et al.,Energetic Proton Generation In Ultra-Intense Laser—Solid Interactions,Physics of Plasmas, Feb. 2001, pp. 542-549, vol. 8, No. 2, American Institute of Physics.

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