Optics: measuring and testing – For size of particles – By particle light scattering
Patent
1998-01-05
1999-12-07
Kim, Robert H.
Optics: measuring and testing
For size of particles
By particle light scattering
356339, 356343, G01N 1502
Patent
active
059992573
ABSTRACT:
In a method for monitoring particulates in stacks or ducts a back-scatter monitor uses a solid-state laser to emit a collimated beam, the intensity of which is controlled via feedback from a reference detector. The beam is split so that part goes to a reference surface for calibration checks, and part is directed to pass at a selected angle through a gaseous sample. Optical energy scattered from particles in the sample is detected by viewing optics to provide an indication of particulate concentration. The beam steering mechanism can direct the optics to view scattering along a selectable axis that intersects the laser beam at a specified location within the gaseous sample. The method can be used to determine the opacity of the gaseous sample providing a basis for correlation to particulate loading of that portion of the particulates that are of a size comparable to the wavelength of light.
REFERENCES:
patent: 3526460 (1970-09-01), Webb
patent: 3797937 (1974-03-01), Shoffner
patent: 3915572 (1975-10-01), Orloff
patent: 4017186 (1977-04-01), Shoffner et al.
patent: 4221485 (1980-09-01), Schulze
patent: 4541719 (1985-09-01), Wyatt
patent: 4577964 (1986-03-01), Hansen, Jr.
patent: 4791427 (1988-12-01), Raber et al.
patent: 5132548 (1992-07-01), Borden et al.
patent: 5173958 (1992-12-01), Folsom et al.
patent: 5471299 (1995-11-01), Kaye et al.
patent: 5565984 (1996-10-01), Girvin
patent: 5767967 (1998-06-01), Yufa
Catalogue of Durag Industrie Elektronik entitled D-R-300 dated Jan., 1993.
Catalogue of Durag Industrie Elektronik entitled Line of Products dated Jan., 1993.
Catalogue of Enviromental Systems Corporation entitled Particulate Monitor Model P-5A, undated.
Sick Optic Electronic Operating, Maintenance and Service Manual GM 30/SO.sub.2 /NO.sub.2 /Opacity Combined Analyzer.
Description and Operation, Cover, pp. 34, 38-41, 44-48, Apr., 1988.
Esko Dust/Opacity Monitor Brochure, MIP Laser/Dust Opacity Monitor For Emission Monitoring And Process Contro.
Insitec Measurement Systems Brochure.
Particle Measurement Systems, Inc., brochure Aerosol Multiplexing Manifold System Model Am-12, Mar., 1985.
TSI Particle Instruments Brochure entitled "New Ideas In," 1994.
Particle Measurement Systems, Inc., Operating Manual for Model 300 Series Continuous Aerosol Monitoring System, Revision 7, Jan., 1989.
Myers Richard
Smierciak Edward A.
Ingersoll, P.C. Buchanan
Kim Robert H.
Ratliff Reginald A.
United Sciences, Inc.
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