Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1992-04-24
1995-01-03
Pham, Hoa Q.
Optics: measuring and testing
By polarized light examination
With light attenuation
356153, 356394, 250561, 359385, G01B 1114
Patent
active
053791061
ABSTRACT:
Planar light sources are directed at an article on either side of the optical axis so that the trace of each light beam defines a line, on either side of the optical axis, whose form is dependent on the shape of the surface of the article. To determine whether the article is in focus, the distance between the two lines is measured. To determine whether the article is in correct pitch, the distance between each line and the optical axis is measured and compared. To determine whether the article has drifted, the distances between the ends of the lines and the optical axis are measured and compared.
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Forensic Technology WAI, Inc.
Pham Hoa Q.
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