Method and apparatus for monitoring a structure

Details Method and apparatus for monitoring a structure Method and apparatus for monitoring a structure

2011-07-19

2011-07-19

Le, John H (Department: 2857)

Data processing: measuring, calibrating, or testing

Measurement system in a specific environment

Mechanical measurement system

C073S862627, C356S033000, C702S034000

Reexamination Certificate

active

07983854

ABSTRACT:
The present disclosure discloses a method of monitoring a structure by a monitoring system including at least one strain gauge positioned on the structure and a computer processor coupled to the at least one strain gauge. According to at least one embodiment, strain data are acquired using the at least one strain gauge, and it is determined, by the computer processor, whether the structure has undergone plastic deformation according to the strain data. Further, a result is outputted according to the determination of plastic deformation.

REFERENCES:
patent: 4566336 (1986-01-01), German et al.
patent: 4815547 (1989-03-01), Dillon et al.
patent: 4872349 (1989-10-01), Espiritu-Santo
patent: 5440499 (1995-08-01), Rasmussen
patent: 6082203 (2000-07-01), Koivisto et al.
patent: 6273613 (2001-08-01), O'Brien et al.
patent: 6415242 (2002-07-01), Weldon et al.
patent: 6650405 (2003-11-01), Lam et al.
patent: 6676075 (2004-01-01), Cowan et al.
patent: 6769315 (2004-08-01), Stevenson et al.
patent: 6895681 (2005-05-01), Yonemura et al.
patent: 0319176 (1989-06-01), None
patent: 2006/067442 (2006-06-01), None
ISR for PCT/GB2005/004975 dated Feb. 27, 2006.
UK Search Report for GB0806918.9 dated Jul. 18, 2008.

Affiliated with

Also associated with

Rating

Method and apparatus for monitoring a structure does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for monitoring a structure, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for monitoring a structure will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-2635740