Computer-aided design and analysis of circuits and semiconductor – Integrated circuit design processing – Physical design processing
Reexamination Certificate
2008-10-29
2011-11-22
Chiang, Jack (Department: 2825)
Computer-aided design and analysis of circuits and semiconductor
Integrated circuit design processing
Physical design processing
C716S112000
Reexamination Certificate
active
08065648
ABSTRACT:
Method, apparatus, and computer readable medium for modeling an integrated circuit in a computer aided design system (CAD) are described. In some examples, a device model of the integrated circuit is generated in at least one first computer file, the device model having a component hierarchy. A common delay identifier is defined for component instances in the component hierarchy of the device model. A value model is generated for the device model in at least one second computer file. Delay values are defined for the common delay identifier in the value model, at least a portion of the delay values being qualified based on location in the component hierarchy of at least one of the component instances.
REFERENCES:
patent: 6820245 (2004-11-01), Beattie et al.
patent: 6828963 (2004-12-01), Rappoport
patent: 7454732 (2008-11-01), McElvain et al.
patent: 7788614 (2010-08-01), Galloway et al.
Brush Robert M.
Cartier Lois D.
Chiang Jack
Maunu LeRoy D.
Tat Binh
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