Thermal measuring and testing – Thermal testing of a nonthermal quantity – Of susceptibility to thermally induced deteriouration – flaw,...
Patent
1989-11-03
1991-06-04
Cuchlinski, Jr., William A.
Thermal measuring and testing
Thermal testing of a nonthermal quantity
Of susceptibility to thermally induced deteriouration, flaw,...
342 53, 374 45, 374 4, 343703, 324630, 324642, G01N 2500, G01N 2572
Patent
active
050209205
ABSTRACT:
A method and apparatus for generating thermal waves in a sample and for measuring thermal inhomogeneities at subsurface levels using millimeter-wave radiometry. An intensity modulated heating source is oriented toward a narrow spot on the surface of a material sample and thermal radiation in a narrow volume of material around the spot is monitored using a millimeter-wave radiometer; the radiometer scans the sample point-by-point and a computer stores and displays in-phase and quadrature phase components of thermal radiations for each point on the scan. Alternatively, an intensity modulated heating source is oriented toward a relatively large surface area in a material sample and variations in thermal radiation within the full field of an antenna array are obtained using an aperture synthesis radiometer technique.
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Gopalsami Nachappa
Raptis Apostolos C.
Albrecht John M.
Cordell Helen S.
Cuchlinski Jr. William A.
Gutierrez Diego F. F.
Moser William R.
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