Method and apparatus for measuring waveforms and wavelengths...

Optics: measuring and testing – By dispersed light spectroscopy – With synchronized spectrum repetitive scanning

Reexamination Certificate

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C356S328000, C356S334000, C398S034000

Reexamination Certificate

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07002680

ABSTRACT:
A method and apparatus for measuring characteristics of a single-wavelength optical signal constituting part of a wavelength division multiplexed (WDM) optical signal is provided. The WDM optical signal is adjustably diffracted to select the single-wavelength optical signal. An optical-to-electrical conversion is performed. An electrical sampling signal representing the selected single-wavelength optical signal is generated by one of (a) optically sampling the selected single-wavelength optical signal to generate an optical sampling signal on which the optical-to-electrical conversion is performed, and (b) electrically sampling an electrical signal generated by performing the optical-to-electrical conversion on the selected single-wavelength optical signal.

REFERENCES:
patent: 4335933 (1982-06-01), Palmer
patent: 4343532 (1982-08-01), Palmer
patent: 4565447 (1986-01-01), Nelson
patent: 4804266 (1989-02-01), Barshad
patent: 6094271 (2000-07-01), Maeda
patent: 6421179 (2002-07-01), Gutin et al.
patent: 10-148581 (1998-06-01), None

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