Method and apparatus for measuring ultrashort optical pulses

Details Method and apparatus for measuring ultrashort optical pulses Method and apparatus for measuring ultrashort optical pulses

1987-09-08

1988-12-20

Willis, Davis L.

Optics: measuring and testing

By particle light scattering

With photocell detection

356346, G01B 902

Patent

active

047922303

ABSTRACT:
A method and apparatus for measuring ultrashort optical pulses is described. Pulse waveforms to be measured are the type which vary at high speed in a time close to or less than the response time of an optical detector. Changes of optical wavelength or frequency are measured at various sections of that pulse. The light to be measured is split into two beams, and recombined after provided with different delay times, respectively. The combined light is caused to enter a doubling crystal to generate a second-harmonic light, and the second-harmonic light component, or both the second-harmonic and fundamental components, is measured. The intensity shape and chirping of the pulses is obtained from the changes in the intensity of these components as a function of delay time difference by Fourier analysis including iterative arithmetic operations.

REFERENCES:
patent: 4505587 (1985-03-01), Haus et al.
patent: 4705397 (1987-11-01), Tsuchiya et al.

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