Method and apparatus for measuring true vertical depth in a...

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Earth science

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C702S009000, C702S158000, C702S159000, C702S166000, C324S328000, C324S333000, C324S335000

Reexamination Certificate

active

07912647

ABSTRACT:
A system for measuring a true vertical depth of a downhole tool is provided. The system includes: a first optical clock located at a first depth and having a first frequency; a second optical clock disposable at a downhole location and having a second frequency at the downhole location; and a processor for receiving the first frequency and the second frequency, and calculating a true vertical depth of the second optical clock based on a difference between the first frequency and the second frequency. A system and computer program product for measuring a true vertical depth of a downhole tool are also provided.

REFERENCES:
patent: 5019978 (1991-05-01), Howard, Jr. et al.
patent: 5420549 (1995-05-01), Prestage
patent: 6837105 (2005-01-01), DiFoggio et al.
patent: 6957580 (2005-10-01), Ekseth et al.
patent: 6976392 (2005-12-01), DiFoggio et al.
patent: 7253671 (2007-08-01), Hall et al.
patent: 2004/0117118 (2004-06-01), Collins et al.
patent: 2007/0189777 (2007-08-01), Arahira
Ch. Salomon, Cold atoms in space and atomic clocks: ACES, Nov. 2001, Académie des sciences/Éditions scientifiques et médicales Elsevier SAS, Comptes Rendus de l'Académie des Sciences—Series IV—Physics, vol. 2, Issue 9, p. 1313-1330.
S. A. Diddams, Th. Udem, J. C. Bergquist, E. A. Curtis, R. E. Drullinger, L. Hollberg, W. M. Itano, W. D. Lee, C. W. Oates, K. R. Vogel, D. J. Wineland1; An Optical Clock Based on a Single Trapped 199Hg+ Ion; Aug. 3, 2001; Science Express; vol. 293. No. 5531, pp. 825-828; DOI: 10.1126/science.1061171.
A. Godone, C. Novero, and P. Tavella; Null gravitational redshift experiment with nonidentical atomic clock; May 1995, The American Physical Society, Phys. Rev. D 51; p. 319-323.
Time Too Good to Be True, [online]; [retrieved on Mar. 19, 2008]; retrieved from the Internet http://www.physicstoday.org/vol-59/iss-3/p10.html.
International Search Report for International Application No. PCT/US2009/034600. Mailed. Sep. 30, 2009.
Written Opinion of the International Searching Authority for International Application No. PCT/US2009/034600. Mailed Sep. 30, 2009.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for measuring true vertical depth in a... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for measuring true vertical depth in a..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring true vertical depth in a... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2760853

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.