Method and apparatus for measuring transverse thickness profile

Details Method and apparatus for measuring transverse thickness profile Method and apparatus for measuring transverse thickness profile

1991-08-29

1993-04-13

Porta, David P.

X-ray or gamma ray systems or devices

Specific application

Absorption

378 55, 378152, G01N 2306

Patent

active

052029093

ABSTRACT:
The invention has an X-ray emitting tube and a linear detector on opposite sides of a plane containing a strip to be measured and an electronic acquisition, measuring and control unit. A mask transversely moveable relative to the strip occludes radiation from the X-ray emitting tube which is not intercepted by the strip or which passes through the edge region of the strip. This device offers an improved degree of precision measurement near the edge of the strip.

REFERENCES:
patent: 3868510 (1975-02-01), Murata et al.
patent: 4891833 (1990-01-01), Bernardi
patent: 4954719 (1990-09-01), Harris
IEEE 40th Annual Conference of Elec. Eng. Problems In Rubber & Plastics Ind Apr. 11, 1988, IEEE pp. 28-34, A new measurement and control system for rubber calendering.

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