Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate
2007-02-13
2007-02-13
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
C324S712000, C324S713000, C324S762010
Reexamination Certificate
active
11477305
ABSTRACT:
A method and apparatus is provided for measuring alternating current (AC) and direct current (DC) characteristics of a plurality of semiconductor devices. A ring oscillator generates pulses to drive the plurality of semiconductor devices under test. Current/Voltage (IV) and transfer characteristics of the plurality of semiconductor devices are measured using only DC input/output.
REFERENCES:
patent: 2004/0263199 (2004-12-01), Braceras et al.
Jenkins, et al., “Characteristics of SOI FET's Under Pulsed Conditions,” IEEE Transactions on Electron Devices, 44 (11), Nov. 1997, 1923-1930.
Bhushan Manjul
Ketchen Mark B.
International Business Machines - Corporation
Nguyen Vincent Q.
Ryan & Mason & Lewis, LLP
Tuchman Ido
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