Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate
2006-12-05
2006-12-05
Nguyen, Vincent Q. (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
C324S762010
Reexamination Certificate
active
07145347
ABSTRACT:
A method and apparatus for measuring alternating current (AC) and direct current (DC) characteristics of a plurality of semiconductor devices. A ring oscillator generates pulses to drive the plurality of semiconductor devices under test. Current/Voltage (IV) and transfer characteristics of the plurality of semiconductor devices are measured using only DC input/output.
REFERENCES:
patent: 3883802 (1975-05-01), Puri
patent: 2003/0193051 (2003-10-01), Beech
Jenkins, et al., “Characteristics of SOI FET's Under Pulsed Conditions,” IEEE Transactions on Electron Devices, 44 (11), Nov. 1997, 1923-1930.
Bhushan Manjul
Ketchen Mark B.
Cheung Wan Yee
Nguyen Vincent Q.
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