Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1991-07-03
1993-09-07
Evans, F. L.
Optics: measuring and testing
By polarized light examination
With light attenuation
356394, G01B 1124
Patent
active
052434060
ABSTRACT:
A method of measuring a wire-shaped object comprises a scanning step of scanning a light beam on the surface of the wire-shaped object, a detection step of detecting a reflected light reflected from the surface of the wire-shaped object by a plurality of optical sensor cells, the optical sensor cells being mounted on an inner wall of a reflected light detection unit located over the wire-shaped object; and a measurement step of measuring a three-dimensional configuration of the wire-shaped object in accordance with output signals from the plurality of optical sensor cells, whereby, the three-dimensional configuration of the wire-shaped object is automatically measured in a short time.
REFERENCES:
patent: 4583861 (1986-04-01), Yamaji et al.
patent: 4728195 (1988-03-01), Silver
patent: 4740708 (1988-04-01), Batchelder
patent: 4942618 (1990-07-01), Sumi et al.
patent: 4973164 (1990-11-01), Weber et al.
IBM Technical Disclosure Bulletin, vol. 32, No. 8B, Jan. 1990, New York, "Lighting Method for Automatic Solder Bond Inspection," pp. 11-12.
Ando Moritoshi
Oshima Yoshitaka
Tsukahara Hiroyuki
Evans F. L.
Fujitsu Limited
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