Electricity: measuring and testing – Fault detecting in electric circuits and of electric components – Of individual circuit component or element
Reexamination Certificate
2006-08-01
2006-08-01
Karlsen, Ernest (Department: 2829)
Electricity: measuring and testing
Fault detecting in electric circuits and of electric components
Of individual circuit component or element
C324S765010
Reexamination Certificate
active
07084649
ABSTRACT:
A method and apparatus are provided that make it possible to speedily measure, and obtain images of, the three-dimensional distribution of electric fields in integrated circuits, using electro-optic sampling. The sampling is performed using a plurality of electric field sensors, each comprising an electro-optic crystal layer, a light-reflecting layer that is in close contact with the electro-optic crystal layer, and a separation layer that is in close contact with the reflection layer, separating the reflection layer from the object to be measured.
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Lo et al; “Proposal for three-dimensional internal field mapping by cw electro-optic probing”; Applied Physics Letters; vol. 50; No. 25; Jun. 22, 1987; pp. 1791-1793.
S. Miyazawa, Advanced Electronics Series, Category I. vol. I-14 Jul. 10, 1995, pp. 96-101, “Electronics Materials, Properites, Devices, Optical Crystals”.
Izutsu Masayuki
Kawanishi Tetsuya
Matsuo Yoshiro
Communications Research Laboratory, Independent Administrative I
Karlsen Ernest
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