Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specified electrical sensor or system
Patent
1984-01-30
1986-02-25
Ciarlante, Anthony V.
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specified electrical sensor or system
73805, 73826, G01N 300
Patent
active
045720010
ABSTRACT:
A method and apparatus for precisely controlling plastic strain rate during plastic deformation testing of a solid material such as a metal or plastic are described in which the effects of elastic strain rates associated with the specimens and machines used for such testing are eliminated by applying corrections proportional to the load on the specimen. Thus strain rate sensitivity, unaffected by the machine or specimen modulus can be measured. Strain rate sensitivity can be used to measure the activation volume of the specimen which may be used for quality control of material processing and/or manufactured articles.
REFERENCES:
patent: 3411345 (1968-11-01), Wintriss
patent: 4012953 (1977-03-01), Ormond
patent: 4030347 (1977-06-01), Norris et al.
patent: 4432240 (1984-02-01), Adams
Basinski Zbigniew
Saimoto Shigeo
Ciarlante Anthony V.
Hicks Richard J.
Queen's University at Kingston
LandOfFree
Method and apparatus for measuring thermodynamic response does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for measuring thermodynamic response, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring thermodynamic response will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1006306