Optics: measuring and testing – Material strain analysis
Patent
1991-09-04
1994-06-07
Rosenberger, Richard A.
Optics: measuring and testing
Material strain analysis
25022718, G01B 1116
Patent
active
053194357
ABSTRACT:
A method and apparatus for measuring the wavelength of spectrally narrow optical signals, particularly from guidedwave structures, is taught, which utilizes a known wavelength dependent transfer function and determining from the resulting signal the wavelength. In a preferred embodiment the spectrally narrow optical signal is divided into at least two signals, followed by optically processing the signals to produce a wavelength dependent change between the signals and determining the wavelength therefrom.
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Liu Kexing
Measures Raymond M.
Melle Serge M.
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