Method and apparatus for measuring the thickness of non-circular

Details Method and apparatus for measuring the thickness of non-circular Method and apparatus for measuring the thickness of non-circular

1997-11-04

1999-07-27

Barlow, John

Data processing: measuring, calibrating, or testing

Calibration or correction system

Length, distance, or thickness

702 94, 702151, 36453828, 356 6, 356387, G01B 1106

Patent

active

059307340

ABSTRACT:
The invention relates to a method for measuring the thickness of non-circular elongated workpieces in which the thickness of the workpiece is measured along three measuring axis, the measurements are fed into a computer to determine minimum and maximum values and associated angular positions of the measuring axis, the measuring systems are rotated to a zero measuring position and the measured thicknesses are correlated by an algorithm, and the computer computes the degree for which angular position of the mimimum and maximum changes when the workpiece is advanced.

REFERENCES:
patent: 3870890 (1975-03-01), Binks et al.
patent: 4432648 (1984-02-01), Musto et al.
patent: 5383022 (1995-01-01), Kaser
patent: 5422861 (1995-06-01), Stringer et al.
patent: 5539675 (1996-07-01), Carroll, Sr. et al.
patent: 5768154 (1998-06-01), Zelt, III et al.
patent: 5815274 (1998-09-01), Dlugos

Affiliated with

Also associated with

Rating

Method and apparatus for measuring the thickness of non-circular does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for measuring the thickness of non-circular, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring the thickness of non-circular will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-892383