Method and apparatus for measuring the thickness of layers coate

Details Method and apparatus for measuring the thickness of layers coate Method and apparatus for measuring the thickness of layers coate

1995-10-30

1997-08-26

Noland, Thomas P.

Measuring and testing

Inspecting

356381, 364563, G01B 2108, G01B 1106

Patent

active

056612508

ABSTRACT:
A method of measuring the thicknesses of each layer coated on the both surfaces of the base material, which includes the steps of: measuring simultaneously a first distance between a first displacement meter and the surface of the layer coated on the one surface of the base material, a second distance between a second displacement meter and the surface of the layer coated on the other surface of the base material, and a third distance between a third displacement meter and the one surface of the base material; calculating a thickness (Ta) of the layer coated on the one surface of the base material by subtracting the value (Da) measured by the first displacement meter from the value (Dc) measured by the third displacement miter; calculating a whole thickness (T) of the coated sheet from the value (Da) measured by the first displacement meter and the value (Db) measured by the second displacement meter; and calculating a thickness (Tb) of the layer coated on the other surface of the base material by subtracting the thickness (Tc) of the base material and the thickness (Ta) of the layer coated on the one surface of the base material from the whole thickness (T).

REFERENCES:
patent: 3892490 (1975-07-01), Uetsuki et al.
patent: 4937093 (1990-06-01), Chino et al.
patent: 5091647 (1992-02-01), Carduner et al.
Patent Abstracts of Japan: Grp p775, vol. 12, No. 399, Abs.pub date, Oct. 24, 1988 (63-139202) "Method and Apparatus for Velectromagnetic Induction Type Thickness".
Patent Abstracts of Japan: Grp p724, vol. 12 No. 233, Abs. pub. date Jul. 5, 1988 (63-26502) "Method and Device for electromagnetic Induction Type Thickness Measurement".

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