Horology: time measuring systems or devices – Time interval – Electrical or electromechanical
Patent
1988-04-08
1989-12-26
Miska, Vit W.
Horology: time measuring systems or devices
Time interval
Electrical or electromechanical
324 73AT, 377 20, G04F 800, G01R 1512
Patent
active
048902705
ABSTRACT:
A circuit for detecting manufacturing deficiencies in semi-conductor devices and selecting marketable chips comprises a speed circuit to determine the speed at which a particular chip operates. The speed circuit is a small, self-contained circuit that may be placed on any type of semi-conductor chip. It includes an oscillator, a counter, and a control logic circuit. The speed circuit is coupled to an external clock and a control processor. The external clock provides a benchmark against which the operation of the chip can be compared. The control processor uses the output of the speed circuit to compute the speed at which the semi-conductor device operates.
REFERENCES:
patent: 3422422 (1969-01-01), Frank et al.
patent: 3859512 (1975-01-01), Ritzinger
patent: 4164648 (1979-08-01), Chu
patent: 4245337 (1981-01-01), Daniels et al.
patent: 4290130 (1981-09-01), Loudenscager
patent: 4456386 (1984-06-01), Dellea
patent: 4461582 (1984-07-01), Walther
patent: 4495628 (1985-01-01), Zasio
patent: 4708491 (1987-11-01), Luitje
patent: 4771251 (1988-09-01), Allen et al.
Miska Vit W.
Sun Microsystems
LandOfFree
Method and apparatus for measuring the speed of an integrated ci does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for measuring the speed of an integrated ci, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring the speed of an integrated ci will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1580909