Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1997-12-02
2000-05-30
Font, Frank G.
Optics: measuring and testing
By polarized light examination
With light attenuation
356375, 356377, 356359, 250561, G01B 1124, G01B 1100, G01N 2100
Patent
active
060697016
ABSTRACT:
A method and an apparatus for measuring the height of an apex of an object with high accuracy without influence of the surface state of the object are disclosed. Correlation coefficients of respective positions of a waveform formed from digital data indicative of the height of the object detected by a head portion of a detector and a previously prepared standard waveform are calculated while moving the waveforms in the vertical and horizontal directions and the height of an apex position of the standard waveform at a position having a largest correlation coefficient from the calculated result is decided as the height of the apex of the object. Accordingly, the height of the apex can be decided from the whole detected waveforms without influence of local abnormality of the reflected light quantity waveform due to minute ruggedness or discoloration of the surface of the object.
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Hashimoto Yutaka
Kazui Shinichi
Sasaki Hideaki
Font Frank G.
Hitachi , Ltd.
Punnoose Roy M.
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