Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Lumped type parameters
Patent
1995-05-11
1997-01-14
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Lumped type parameters
324658, 324661, G01R 2726
Patent
active
055943535
ABSTRACT:
A method and apparatus for calculating a ratio, R, having a first capacitance value, C.sub.1, in inverse relation to a second capacitance value, C.sub.2, where C.sub.1 and C.sub.2 are the capacitance values of a first capacitor and a second capacitor respectively. The first and second capacitors each have an independent electrode and share a common electrode. An AC voltage is applied to the common electrode producing first and second AC current signals at the two independent electrodes. A dual switched-capacitor integrated circuit and two current to frequency converters respectively convert the first and second AC current signals to first and second frequency signals having values f.sub.1 and f.sub.2. A microprocessor receives the first and second frequency signals and calculates R from f.sub.1 and f.sub.2.
REFERENCES:
patent: 4093915 (1978-06-01), Briefer
patent: 4310806 (1982-01-01), Ogasawara
patent: 5197429 (1993-03-01), Kita
patent: 5283528 (1994-02-01), van Seeters
patent: 5323118 (1994-06-01), Tonogai et al.
patent: 5497101 (1996-03-01), Fillion
Brown Glenn W.
Elsag International N.V.
Katterle Paul R.
Wieder Kenneth A.
LandOfFree
Method and apparatus for measuring the change in capacitance val does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for measuring the change in capacitance val, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring the change in capacitance val will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1390912