Method and apparatus for measuring temperature profile with a si

Details Method and apparatus for measuring temperature profile with a si Method and apparatus for measuring temperature profile with a si

1985-05-28

1986-03-18

Frankfort, Charles

Thermal measuring and testing

Temperature measurement

In spaced noncontact relationship to specimen

374137, 374161, 356 43, G01J 508

Patent

active

045764859

ABSTRACT:
A method and apparatus for determining a temperature profile along a single optical fiber. The temperature profile is determined by measuring the output power spectral distribution. By measuring n points along the spectral power distribution curve, n "resolution elements" of temperature can be determined.

REFERENCES:
patent: 3635088 (1972-01-01), Poncet
patent: 4151747 (1979-05-01), Gottlieb et al.
patent: 4215275 (1980-07-01), Wickersheim
patent: 4251137 (1981-02-01), Knop et al.
patent: 4362057 (1982-12-01), Gottlieb et al.
"Automated AOTP Infrared Analyzer", Steinbruegge et al., SPIE Proceedings, vol. 268, p. 160, 1981.
Gottlieb et al, "Fiber-Optic Temperature Sensor Based on Internally Generated Thermal Radiation", Applied Optics, Oct. 1, 1981, pp. 3408-3414, vol. 20, No. 19.

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