Method and apparatus for measuring temperature

Details Method and apparatus for measuring temperature Method and apparatus for measuring temperature

1974-11-04

1977-09-27

Myracle, Jerry W.

Measuring and testing

Gas analysis

Moisture content or vapor pressure

G01K 716

Patent

active

040503097

ABSTRACT:
Temperature dependent and reference time intervals are simultaneously generated and differentially combined to provide a temperature signal that is employed to generate a probe linearization signal for combination with the temperature signal and digital display. A low resistance platinum probe carries a low current in a timing circuit having a small capacitor charging to a relatively high voltage to provide a high gain for temperature to time conversion circuitry. A continuous real time probe linearization signal is computed for large temperature readings by a double integration circuit having an adjustable readout time for determining the magnitude of the twice integrated temperature signal.

REFERENCES:
patent: 3111662 (1963-11-01), Pierce
patent: 3477292 (1969-11-01), Thornton
patent: 3620082 (1971-11-01), Peters
patent: 3688581 (1972-09-01), LeQuernec
patent: 3766782 (1973-10-01), Shimomura
patent: 3824585 (1974-07-01), Meijer
patent: 3834238 (1974-09-01), Mueller et al.
patent: 3843872 (1974-10-01), Shimomura
patent: 3872726 (1975-03-01), Kauffeld et al.

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