Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1993-12-02
1995-04-25
Turner, Samuel A.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356357, 356432, G01B 902
Patent
active
054104050
ABSTRACT:
A system for non-destructively measuring an object and controlling industrial processes in response to the measurement is disclosed in which an impulse laser generates a plurality of sound waves over timed increments in an object. A polarizing interferometer is used to measure surface movement of the object caused by the sound waves and sensed by phase shifts in the signal beam. A photon multiplier senses the phase shift and develops an electrical signal. A signal conditioning arrangement modifies the electrical signals to generate an average signal correlated to the sound waves which in turn is correlated to a physical or metallurgical property of the object, such as temperature, which property may then be used to control the process. External, random vibrations of the workpiece are utilized to develop discernible signals which can be sensed in the interferometer by only one photon multiplier. In addition the interferometer includes an arrangement for optimizing its sensitivity so that movement attributed to various waves can be detected in opaque objects. The interferometer also includes a mechanism for sensing objects with rough surfaces which produce speckle light patterns. Finally the interferometer per se, with the addition of a second photon multiplier is capable of accurately recording beam length distance differences with only one reading.
REFERENCES:
patent: 3601490 (1971-08-01), Erickson
patent: 3694088 (1972-09-01), Gallagher et al.
patent: 3978713 (1976-09-01), Penney
patent: 4144767 (1979-03-01), Kaule et al.
patent: 4201473 (1980-05-01), Domenicali et al.
patent: 4225240 (1980-09-01), Balasubramanian
patent: 4255971 (1981-03-01), Rosenewaig
patent: 4468551 (1984-08-01), Neiheisel
patent: 4469450 (1984-09-01), DiVincenzo
patent: 4522510 (1985-06-01), Rosenewaig et al.
patent: 4539846 (1985-09-01), Grossman
patent: 4541280 (1985-09-01), Cielo et al.
patent: 4622202 (1986-11-01), Yamada et al.
patent: 4633715 (1987-01-01), Monchalin
patent: 4655608 (1987-04-01), Goss et al.
patent: 4659224 (1987-04-01), Monchalin
patent: 4762425 (1988-08-01), Shakkottai et al.
patent: 4966459 (1990-10-01), Monchalin
patent: 5052661 (1991-10-01), Dunlay et al.
patent: 5080491 (1992-01-01), Monchalin
patent: 5136172 (1992-08-01), Nakata et al.
patent: 5137361 (1992-08-01), Heon et al.
P. 61 of the Apr. 1991 issue of NASA Tech Briefs.
"New Sensors for Ultrasound: Measuring Temperature Probe Files;" appearing in Materials & Standards, vol. 10, No. 8 (Aug., 1970).
"The Ultrasonic Thermometer-Construction, Application, and Operating Experience" appearing in High Temperature-High Pressures, 1972, vol. 4, No. 4 pp. 447-481.
McGraw-Hill Encyclopedia of Science & Technology, 1987 edition, vol. 9, pp. 289-297.
Brochure from Zygo Corp. "Mark IVxp Interferometer System" Jan. 1990.
"Polarization Interferometers", Mallick, Wiley-Interscience, pp. 45-67, Dec. 1990.
Kotidis Petros A.
Rostler Peter S.
Schultz Thomas J.
Woodroffe Jaime A.
Textron Defense Systems, Division of Avco Corp.
Turner Samuel A.
LandOfFree
Method and apparatus for measuring surface movement of a solid o does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for measuring surface movement of a solid o, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring surface movement of a solid o will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1571615