Optics: measuring and testing – Of light reflection
Patent
1992-10-23
1995-01-03
McGraw, Vincent P.
Optics: measuring and testing
Of light reflection
356352, 505842, G01N 2155
Patent
active
053791100
ABSTRACT:
The surface characteristics with respect to a high-frequency electromagnetic field of a material to be tested are measured by placing opposite a flat mirror material to be tested one of a pair of concave spherical reflection mirrors fabricated in the same way and formed with high-reflectance circular coupling regions, placing the other spherical reflection mirror at a position symmetrical to the one reflection mirror with respect to the flat mirror material as the plane of symmetry, measuring the Q value of the open resonator formed by the one reflection mirror and the flat mirror material, removing the flat mirror material from the optical axis, measuring the Q value of the open resonator formed by the pair of spherical reflection mirrors, calculating the absolute value of the reflectance of the flat mirror material to be tested from the difference between the two measured Q values, and calculating the phase of the reflected wave at the surface of the flat mirror material to be tested from the measured resonance position.
REFERENCES:
patent: 5012212 (1991-04-01), Matsui et al.
The 13th International Conference on Infrared and Millimeter Waves, Dec. 5-9, 1988, 2 pages, T. Matsui, et al., "An Open Resonator for Testing Surface Resistivity of Superconductor Films & Metallic Samples at 100-120 GHz".
Araki Kenichi
Matsui Toshiaki
Communications Research Laboratory Ministry of Posts and
Keesee LaCharles
McGraw Vincent P.
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