Method and apparatus for measuring structures in a fingerprint

Details Method and apparatus for measuring structures in a fingerprint Method and apparatus for measuring structures in a fingerprint

2006-09-19

2006-09-19

Bali, Vikkram (Department: 2624)

Image analysis

Applications

Personnel identification

C382S284000, C382S323000

Reexamination Certificate

active

07110577

ABSTRACT:
Method and apparatus for the measuring of structures in a fingerprint or the like, comprising the measuring of chosen characteristics of the surface of the fingerprint, e.g. by measuring capacitance or resistivity, using a sensor array comprising a plurality of sensors, being positioned in contact with, or close to, a portion of the surface. The characteristics are measured in at least one line of measuring points along an elongated portion of the surface at given intervals of time, the sensor array being an essentially one-dimensional array, moving the surface in relation to the sensor array in a direction perpendicular to the sensor array, so that the measurements are performed at different, or partially overlapping, portions of the surface, combining the measurements of the measured portions of the surface to provide a segmented, two-dimensional representation of said characteristics of the surface.

REFERENCES:
patent: 3622989 (1971-11-01), Dowdy, Sr.
patent: 4353056 (1982-10-01), Tsikos
patent: 4394773 (1983-07-01), Ruell
patent: 4429413 (1984-01-01), Edwards
patent: 4784484 (1988-11-01), Jensen
patent: 5325442 (1994-06-01), Knapp
patent: 5503029 (1996-04-01), Tamori
patent: 5559504 (1996-09-01), Itsumi et al.
patent: 5828773 (1998-10-01), Setlak et al.
patent: 5841888 (1998-11-01), Setlak et al.
patent: 5845005 (1998-12-01), Setlak et al.
patent: 5852670 (1998-12-01), Setlak et al.
patent: 5862248 (1999-01-01), Salatino et al.
patent: 5864296 (1999-01-01), Upton
patent: 5903225 (1999-05-01), Schmitt et al.
patent: 5920640 (1999-07-01), Salatino et al.
patent: 5940526 (1999-08-01), Setlak et al.
patent: 5942761 (1999-08-01), Tuli
patent: 5953441 (1999-09-01), Setlak
patent: 5956415 (1999-09-01), McCalley et al.
patent: 5963679 (1999-10-01), Setlak
patent: 6289114 (2001-09-01), Mainguet
patent: 735502 (1996-10-01), None
patent: 8154921 (1996-06-01), None
patent: 10003532 (1998-01-01), None
patent: 10222641 (1998-08-01), None
patent: 8606266 (1986-11-01), None
patent: 9600082 (1996-01-01), None
patent: 9632061 (1996-10-01), None

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