Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1991-05-22
1994-09-06
Turner, Samuel A.
Optics: measuring and testing
By particle light scattering
With photocell detection
G01B 902
Patent
active
053453069
ABSTRACT:
In the method of and apparatus for measuring a spectral absorption in an opaque specimen, a scattering specimen is illuminated with highly directional light of variable wavelength from a specific direction, thereby removing scattered rays as much as possible, and thus detecting the intensity of only parallel rays of a component transmitted or reflected in a specific direction (i.e., rectilinear component rays) by use of a highly directional detecting system, for example, a heterodyne light-receiving system, Michelson light-receiving system, highly directional optical system, etc. It is therefore possible to measure spectral absorption characteristics of a scattering specimen with high accuracy without picking up scattered light in other undesired directions nor other noise light. In addition, the measurement of the control is exceedingly simplified in comparison to the conventional method and thus the measurement is extremely facilitated. Thus, the method and apparatus of the present invention are suitable for measuring spectral absorption of a component transmitted or reflected in a specific direction in not only sparse heterogeneous systems having spatial resolving power, for example, suspensions, organic tissues, etc., but also dense translucent objects.
REFERENCES:
patent: 3753619 (1973-08-01), Thorpe et al.
patent: 4652755 (1987-03-01), Solomon et al.
"Nondestructive Refractive Index Characterization", GEC Journal of Research vol. 3, No. 3, 1985, Great Baddow Chemsfo, pp. 204-207; S. Ball.
Ichimura Tsutomu
Inaba Fumio
Ichimura Tsutomu
Research Development Corporation of Japan
Turner Samuel A.
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