Measuring and testing – Specimen stress or strain – or testing by stress or strain... – Specimen clamp – holder – or support
Reexamination Certificate
2008-01-28
2010-02-23
Caputo, Lisa M (Department: 2855)
Measuring and testing
Specimen stress or strain, or testing by stress or strain...
Specimen clamp, holder, or support
Reexamination Certificate
active
07665367
ABSTRACT:
A method for measuring the shape of a heating treatment jig to be held by a holding portion of a vertical heat treatment apparatus includes measuring the shape of the heat treatment jig in a state that the position of a supporting portion for supporting the heat treatment jig is set to be the same as the position of the holding portion for the heat treatment jig in the vertical heat treatment apparatus. The heat treatment jig can be used for placing a semiconductor wafer to be subjected to heat treatment.
REFERENCES:
patent: 6796439 (2004-09-01), Araki
patent: 7112812 (2006-09-01), Schauer
patent: 7163393 (2007-01-01), Adachi
patent: 7169018 (2007-01-01), Kundracik
patent: 7230680 (2007-06-01), Fujisawa et al.
patent: 7442038 (2008-10-01), Adachi
patent: 7474386 (2009-01-01), Fujisawa et al.
patent: 7-45691 (1995-02-01), None
patent: 9-199438 (1997-07-01), None
patent: 2005-101161 (2005-04-01), None
Mishiro Hitoshi
Nakamura Atsushi
Asahi Glass Company Limited
Caputo Lisa M
Kirkland, III Freddie
Oblon, Spivak McClelland, Maier & Neustadt, L.L.P.
LandOfFree
Method and apparatus for measuring shape of heat treatment jig does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for measuring shape of heat treatment jig, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring shape of heat treatment jig will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4168522