Method and apparatus for measuring relative, within-die...

Details Method and apparatus for measuring relative, within-die... Method and apparatus for measuring relative, within-die...

2007-03-20

2007-03-20

Nguyen, Ha Tran (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

C324S762010

Reexamination Certificate

active

10816018

ABSTRACT:
A leakage inverter has a switching delay in one direction that is directly proportional to the drain or gate leakage current of either an n-type or p-type device. For one aspect, a leakage ring oscillator includes an odd number of inverters including at least one leakage inverter such that the frequency of oscillation of the leakage ring oscillator is directly proportional to local device leakage. For another aspect, a leakage ring oscillator may be used to indicate temperature and/or temperature variation on a die.

REFERENCES:
patent: 4922140 (1990-05-01), Gahle et al.
patent: 5410278 (1995-04-01), Itoh et al.
patent: 5796313 (1998-08-01), Eitan
patent: 6657504 (2003-12-01), Deal et al.

Affiliated with

Also associated with

Rating

Method and apparatus for measuring relative, within-die... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for measuring relative, within-die..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring relative, within-die... will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-3761450