Method and apparatus for measuring properties of weak...

Electrolysis: processes – compositions used therein – and methods – Electrolytic analysis or testing

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C324S698000, C324S425000, C204S404000, C205S777500, C422S053000

Reexamination Certificate

active

08007655

ABSTRACT:
A method and system for determining chemical properties of a fluid. The method and system include providing a weak electrolyte fluid, a container for the fluid, a detection method performed by a device having at least two electrodes, a detection and amplification device coupled to the electrodes and a sensed current compared to an uncontaminated, base fluid or compared to data characteristic of fluid contaminated or chemically changed in order to monitor and characterize the fluid.

REFERENCES:
patent: 2752566 (1956-06-01), Quinton
patent: 3645669 (1972-02-01), Rausch
patent: 3763007 (1973-10-01), Seyl
patent: 3876916 (1975-04-01), Stoakes
patent: 3876935 (1975-04-01), Guillermie et al.
patent: 4007629 (1977-02-01), Hochstein
patent: 4029554 (1977-06-01), Ellison
patent: 4506337 (1985-03-01), Yasuhara
patent: 4646070 (1987-02-01), Yasuhara et al.
patent: 4675662 (1987-06-01), Kondo et al.
patent: 4677847 (1987-07-01), Sawatari et al.
patent: 4701713 (1987-10-01), Eaton et al.
patent: 4706193 (1987-11-01), Imajo et al.
patent: 4733556 (1988-03-01), Meitzler et al.
patent: 4741204 (1988-05-01), Luck et al.
patent: 4744870 (1988-05-01), Kauffman
patent: 4764258 (1988-08-01), Kauffman
patent: 4796204 (1989-01-01), Inoue
patent: 5023133 (1991-06-01), Yodice et al.
patent: 5071527 (1991-12-01), Kauffman
patent: 5089780 (1992-02-01), Megerle
patent: 5139626 (1992-08-01), Yamaguchi et al.
patent: 5146169 (1992-09-01), Morishita et al.
patent: 5262732 (1993-11-01), Dickert et al.
patent: 5274335 (1993-12-01), Wang et al.
patent: 5435170 (1995-07-01), Voelker et al.
patent: 5506501 (1996-04-01), Fogel et al.
patent: 5518590 (1996-05-01), Fang
patent: 5523692 (1996-06-01), Kuroyanagi et al.
patent: 5604441 (1997-02-01), Freese, V et al.
patent: 5644239 (1997-07-01), Huang et al.
patent: 5750887 (1998-05-01), Schricker
patent: 5754055 (1998-05-01), McAdoo et al.
patent: 5789665 (1998-08-01), Voelker et al.
patent: 5824889 (1998-10-01), Park et al.
patent: 5929754 (1999-07-01), Park et al.
patent: 6132593 (2000-10-01), Tan
patent: 6217745 (2001-04-01), Fang
patent: 6236211 (2001-05-01), Wynn
patent: 6236212 (2001-05-01), Wynn
patent: 6278281 (2001-08-01), Bauer et al.
patent: 6286363 (2001-09-01), Discenzo
patent: 6380746 (2002-04-01), Polczynski et al.
patent: 6449538 (2002-09-01), Kubo et al.
patent: 6549015 (2003-04-01), Horie et al.
patent: 6551479 (2003-04-01), Graham et al.
patent: 6577112 (2003-06-01), Lvovich et al.
patent: 6590402 (2003-07-01), Wang et al.
patent: 6598464 (2003-07-01), Rossi
patent: 6644095 (2003-11-01), Van Mullekom et al.
patent: 6718819 (2004-04-01), Schoess
patent: 6791334 (2004-09-01), Horie et al.
patent: 6799458 (2004-10-01), Ismail et al.
patent: 6853203 (2005-02-01), Beylich et al.
patent: 6859039 (2005-02-01), Horie et al.
patent: 6867603 (2005-03-01), Nicholson et al.
patent: 7019654 (2006-03-01), Danyluk et al.
patent: 7038459 (2006-05-01), Wakabayashi
patent: 7043402 (2006-05-01), Phillips et al.
patent: 7043967 (2006-05-01), Kauffman et al.
patent: 7266472 (2007-09-01), Neumann et al.
patent: 7299682 (2007-11-01), Boyle et al.
patent: 7391225 (2008-06-01), Lee et al.
patent: 2002/0113596 (2002-08-01), Horie et al.
patent: 2003/0112012 (2003-06-01), Mosley et al.
patent: 2005/0183969 (2005-08-01), Luopa et al.
patent: 2005/0241948 (2005-11-01), Han et al.
patent: 2008/0066543 (2008-03-01), Sabini et al.
patent: 2008/0068025 (2008-03-01), Gold et al.
Smiechowski, Matthew F., “Electrochemical Characterization of Lubricants for Microfabricated Sensor Applications”, DRC Repository, 2005, 4 pages, OhioLINK Electronc Thesis and Dissertation Center, Case Western Reserve University ETDs, http://drc.ohiolink.edu/handle/2374.OX/16080.
International Bureau of WIPO, “Notification Concerning Transmittal of International Preliminary Report on Patentability”; Feb. 4, 2010.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for measuring properties of weak... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for measuring properties of weak..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring properties of weak... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-2778235

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.