Method and apparatus for measuring profile of three-dimensional

Details Method and apparatus for measuring profile of three-dimensional Method and apparatus for measuring profile of three-dimensional

1986-11-25

1988-12-27

Westin, Edward P.

Radiant energy

Photocells; circuits and apparatus

Optical or pre-photocell system

356376, 358107, G01B 1124

Patent

active

047942622

ABSTRACT:
A method of measuring the profile of a three-dimensional object including the steps of scanning the surface of the object to be measured with a slit-ray, forming an optical image of the surface of the object on an imaging plane of a nonscanning type two-dimensional image sensor which is composed of a plurality of mutually independent photosensors, measuring each time interval between a time when the slit-ray passes a predetermined point and a time when reflected rays are received by any of each of the plurality of mutually independent photosensors, storing each of the time intervals measured in separate memory means with a one to one correspondence between the position of each of the plurality of photosensors and each of the plurality of separate memory means and determining the profile from the time interval stored.

REFERENCES:
patent: 4472056 (1984-09-01), Nakagawa et al.
patent: 4494874 (1985-01-01), DiMatteo et al.

Affiliated with

Also associated with

Rating

Method and apparatus for measuring profile of three-dimensional does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for measuring profile of three-dimensional , we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring profile of three-dimensional will most certainly appreciate the feedback.

Rate now

Comments { 0 }

Profile ID: LFUS-PAI-O-869295