Optics: measuring and testing – By light interference – Having polarization
Reexamination Certificate
2007-06-05
2007-06-05
Lee, Hwa (Andrew) (Department: 2886)
Optics: measuring and testing
By light interference
Having polarization
C356S073100
Reexamination Certificate
active
10544638
ABSTRACT:
Apparatus for measuring polarization mode dispersion (PMD) of a device, e.g. a waveguide, comprises a broadband light source (10,12) for passing polarized broadband light through the device (14), an interferometer (20) for dividing and recombining light that has passed through the device to form interferograms, a polarization separator (30) for receiving the light from the interferometer and separating such received light along first and second orthogonal Feb. 25, 2003 Feb. 25, 2003 polarization states, detectors (32x,32y) for converting the first and second orthogonal polarization states, respectively, into corresponding first and second electrical signals (Px(τ),Py(τ)), and a processor (36) for computing the modulus of the difference and such, respectively, of the first and second electrical signals to produce a cross-correlation envelope (EC(τ)) and an auto-correlation envelope (Ec(τ)), and determining the polarization mode dispersion according to the expression PMD=where and τ is the delay difference between the paths of the interferometer.
REFERENCES:
patent: 6654105 (2003-11-01), Wang et al.
P. Oberson, K. Julliard, N. Gisin, R. Passy. and J.P. Von der Weid, “Interferometric polarization mode dispersion measurements with femtosecond sensitivity,” J. Lightwave Technol., vol. 15, pp. 1852-1857, 1997.
Adams Thomas
EXFO Electro-Optical Engineering Inc.
Lee Hwa (Andrew)
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