Optics: measuring and testing – By polarized light examination
Reexamination Certificate
2007-12-04
2007-12-04
Punnoose, Roy M. (Department: 2886)
Optics: measuring and testing
By polarized light examination
C356S367000, C356S368000, C356S369000
Reexamination Certificate
active
11359014
ABSTRACT:
A method of nonlinear polarimetry for measuring higher order moments of the E field of an optical signal is provided. The method includes imposing a phase delay on a first polarization of a received optical signal with respect to a second polarization of the optical signal to produce an intermediate optical signal having a time varying polarization. A polarization of the intermediate optical signal is suppressed. The intermediate optical signal is detected with a plurality of photodetectors, with at least one photodetector configured to be responsive to a nonlinear optical process. Spectra of the photodetector outputs are calculated to determine higher order moments of the E field, and the moments are transformed to obtain the polarization measurement.
REFERENCES:
patent: 5757494 (1998-05-01), Green et al.
patent: 6211957 (2001-04-01), Erdogan et al.
patent: 6816261 (2004-11-01), Patel et al.
patent: 2003/0067602 (2003-04-01), Patel et al.
patent: 2004/0207843 (2004-10-01), Westbrook
U.S. Appl. No. 10/413,962, filed on Apr. 15, 2003, entitled “Method and Apparatus for Measuring Polarization”, allowed on Jan. 12, 2006 to Paul S. Westbrook.
Lucent Technologies - Inc.
Punnoose Roy M.
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