Method and apparatus for measuring pinch-off voltage of a field

Details Method and apparatus for measuring pinch-off voltage of a field Method and apparatus for measuring pinch-off voltage of a field

1998-04-07

2000-08-29

Brown, Glenn W.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324765, 324766, G01R 3126

Patent

active

061114235

ABSTRACT:
A pinch-off voltage measurement circuit for measuring the pinch-off voltage of a field effect transistor. The circuit uses a measuring capacitor and connection circuit. A voltage is applied to the transistor and an impedance change is detected via the connection circuit. The connection circuit includes first and second detection terminals to which a measuring means is connected, one side of a measuring capacitor being connected to one of the detection terminals; a first element connection terminal to which one of the source and drain of said field effect transistor is connected; a second element connection terminal to which the other of the source and drain is connected; and a third element connection terminal to which the gate is connected, the one detection terminal to which said measuring capacitor is connected and the third element connection terminal are short-circuited, an opposite side of said measuring capacitor is connected to one of said first element connection terminal and the second element connection terminal and having a capacitance value sufficiently larger than the transistor capacitance between the source or drain and the gate in said field effect transistor.

REFERENCES:
patent: 3648170 (1972-03-01), Embree et al.
patent: 4638341 (1987-01-01), Baier et al.

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