Optics: measuring and testing – By polarized light examination – With polariscopes
Patent
1982-09-27
1986-05-20
Willis, Davis L.
Optics: measuring and testing
By polarized light examination
With polariscopes
250225, G01N 2121
Patent
active
045897760
ABSTRACT:
A method and apparatus for measuring optical properties of materials such as optical rotation, depolarization and absorption includes a light source emitting a primary beam of light that is monochromatic, collimated and plane-polarized and a sample cell through which this beam is passed. The primary beam is split into at least two components by a beam splitter and each component is passed through an analyzer, such as a prism. The two analyzers have polarizing axes oriented at a non-zero angle with respect to one another and at pre-selected angles with respect to the plane of polarization of the original beam. Signals corresponding to the intensities of the components are produced by detectors and then the signals are amplified, digitalized and processed to yield the optical properties. A third test component may alternately be split from the primary beam after it has been passed through the sample with this test component also being detected and processed. A reference component may be split from the primary beam before it is passed through the sample, and the reference component is detected and processed. Existing optical components are assembled to accomplish these steps, and a monochrometer may be used with a selected light source to vary the wavelength of the primary beam.
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Carver David
Tait Thomas A.
Chiratech, Inc.
Koren Matthew W.
Martin Timothy J.
Willis Davis L.
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