Electricity: measuring and testing – Magnetic – Magnetic information storage element testing
Patent
1992-05-08
1994-03-08
Snow, Walter E.
Electricity: measuring and testing
Magnetic
Magnetic information storage element testing
365201, 369 55, G01R 3312, G11B 390, G11B 2736, G11C 706
Patent
active
052931161
ABSTRACT:
At the wafer level, a conventional write signal is applied to a pre-selected thin film head. Thereafter, first and second constant amplitude, differing frequency sine wave signals are applied to the head along with a DC bias signal whose magnitude is varied. The level of frequency mixing in the output signal of the head is detected at each level of magnitude of the DC bias signal and this data is utilized in predicting the level of noise in the read-back signal of the thin film head during normal read and write operations in connection with a rotating storage disk.
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Horne Donald E.
Kasiraj Prakash
Sargent Fior D.
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