Method and apparatus for measuring non-reciprocal loss of thin m

Radiant energy – Photocells; circuits and apparatus – Optical or pre-photocell system

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356369, G02F 101, G01J 400

Patent

active

048662640

ABSTRACT:
Method and apparatus for high accuracy measurement of non-reciprocal reflectivity of magnetic thin film materials and magnetic mirrors. An ellipsometer which employs a Helmholtz coil to supply magneto-optic modulation to p-polarized light and an acousto-optic modulator to provide intensity modulation is utilized in conjunction with a novel scheme of analyzer rotation and computational techniques to accurately measure non-reciprocal reflectivity. A microcomputer is used to provide controlled rotation of polarizing elements, data logging, data analysis, and output. The non-reciprocal reflectivity value is determined by the slope of the measured ratio of magneto-optically modulated and absolute intensities (.delta.I.sub.magnetic /I.sub.total), plotted against a function of the analyzer angle G(.PSI.).

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