Method and apparatus for measuring nip width in an image...

Electrophotography – Control of electrophotography process – Control of fixing

Reexamination Certificate

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C399S322000, C399S328000

Reexamination Certificate

active

07903991

ABSTRACT:
A method and apparatus for measuring nip width in an image production device is disclosed. The method may include receiving a signal to measure the nip width, the nip width being the distance of an arc length created by an intersection of a fuser roll and a pressure roll, positioning a nip width measuring device into the nip, measuring the nip width, determining if the measured nip width meets a required nip width, wherein if the measured nip width does not meet the required nip width, adjusting the nip width.

REFERENCES:
patent: 4397097 (1983-08-01), Damrau et al.
patent: 5598639 (1997-02-01), Webb
patent: 6819890 (2004-11-01), Bott et al.
patent: 2005/0220473 (2005-10-01), Bott et al.

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