Method and apparatus for measuring multi-path interference...

Optics: measuring and testing – By light interference – Using fiber or waveguide interferometer

Reexamination Certificate

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C356S073100

Reexamination Certificate

active

06999177

ABSTRACT:
Power of multi-path interference light is measured by setting the cycle of pulse modulation for a light source in correspondence with the length of an optical medium of a target to be measured, by inputting pulse light after being modulated to the target to be measured, by modulating the pulse signal light output from the target to be measured with the use of a pulse signal for modulation having the same cycle as the set cycle, and by observing the wavelength dependency of the power of the light after being modulated. In this way, a modulation condition is set according to a condition of a target to be measured when multi-path interference light caused by double Rayleigh scattering light or reflection at the end of a connector is measured with a pulse-OSA method, so that measurement accuracy is improved.

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patent: 0 702 437 (1996-03-01), None
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S. Muro, et al., “Transient Response of Double Reyleigh Scattering in Optical Time-Domain Extinction Method” Optical Society of America Jul. 2002.
S.A.E. Lewis, et al., “Characterization of Double Rayleigh Scatter Noise in Raman Amplifiers”, IEEE Photonic Technology Letters, vol. 12, No. 5, pp. 528-530, May 2000.
European Search Report for coresponding European Patent application, Serial No. 03001356.9, mailed Oct. 18, 2004.
S. Muro, et al., “Transient Response of Double Rayleigh Scattering in Optical Time-Domain Extinction Method” Optical Society of America, Jul. 2002.
Lewis et al., “Characterization of Double Rayleigh Scatter Noise in Raman Amplifiers” IEEE Photonic Technology Letters, vol. 12, No. 5, May 2000, pp. 528-530.

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