Method and apparatus for measuring minority carrier lifetimes an

Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Frequency of cyclic current or voltage

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324 22, G01R 31024

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041223837

ABSTRACT:
Carrier lifetimes and bulk diffusion length are qualitatively measured as a means for qualification of a P-N junction photovoltaic solar cell by alternately applying high frequency (blue) monochromatic light pulses and low-frequency (red) monochromatic light pulses to the cell while it is irradiated by light from a solar simulator, and synchronously displaying the derivative of the output voltage of the cell on an oscilloscope. This output voltage is a measure of the lifetimes of the minority carriers (holes) in the diffused N layer and majority carriers (electrons) in the bulk P material, and of the diffusion length of the bulk silicon. By connecting a reference cell in this manner with a test cell to be tested in reverse parallel, the display of a test cell that matches the reference cell will be a substantially zero output.

REFERENCES:
patent: 3206674 (1965-09-01), Thuy
patent: 3745454 (1973-07-01), Nikirk
patent: 3919639 (1975-11-01), Graff
S. M. Sze, Physics of Semiconductor Devices, Wiley-Interscience, John Wiley and Sons, New York-London-Sydney-Toronto, pp. 65-72.

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