Method and apparatus for measuring matter properties

Details Method and apparatus for measuring matter properties Method and apparatus for measuring matter properties

2006-03-28

2006-03-28

Bruce, David V (Department: 2882)

X-ray or gamma ray systems or devices

Specific application

Absorption

C378S004000, C378S062000, C382S132000

Reexamination Certificate

active

07020240

ABSTRACT:
Embodiments of methods, apparatuses, devices, and/or systems for determining matter properties are described.

REFERENCES:
patent: 6633626 (2003-10-01), Trotter et al.
patent: 6674835 (2004-01-01), Kaufhold et al.
patent: 2003/0072409 (2003-04-01), Kaufhold et al.
patent: 2003/0147491 (2003-08-01), Gonzalez Trotter et al.
patent: 2003/0215057 (2003-11-01), Trotter et al.

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