Optics: measuring and testing – By dispersed light spectroscopy – Utilizing a spectrometer
Patent
1999-05-25
2000-06-13
Kim, Robert H.
Optics: measuring and testing
By dispersed light spectroscopy
Utilizing a spectrometer
356359, 356432T, G01B 902
Patent
active
060756020
ABSTRACT:
The invention provides an apparatus for measuring a property of a sample (using, e.g., ISTS) that includes: 1) an excitation laser that generates an excitation laser beam; 2) an optical system aligned along an optical axis that separates the excitation laser beam into at least three sub-beams; 3) an imaging system aligned along the optical axis that collects the sub-beams and focuses them onto the sample to form an optical interference pattern that generates a time-dependent response in the sample; 4) a probe laser that generates a probe laser beam that diffracts off the time-dependent response to form a signal beam; 5) a detector that detects the signal beam and in response generates a radiation-induced electronic response; and 6) a processor that processes the radiation-induced electronic response to determine the property of the sample.
REFERENCES:
patent: 5285438 (1994-02-01), Marchand et al.
patent: 5344236 (1994-09-01), Fishman
patent: 5361638 (1994-11-01), Pettersson et al.
patent: 5479256 (1995-12-01), Tami et al.
patent: 5633711 (1997-05-01), Nelson et al.
patent: 5734470 (1998-03-01), Rogers et al.
Banet Matthew J.
Fuchs Martin
Rogers John A.
Active Impulse Systems Inc.
Kim Robert H.
Piotrowski Tony E.
LandOfFree
Method and apparatus for measuring material properties using tra does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for measuring material properties using tra, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring material properties using tra will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2073602