Method and apparatus for measuring locally and superficially...

Optical waveguides – Optical waveguide sensor

Reexamination Certificate

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

C356S446000, C356S445000, C356S432000, C356S012000

Reexamination Certificate

active

06850656

ABSTRACT:
We present a method and apparatus for local and superficial measurement of the optical properties of turbid media. The depth probed is on the order of 1 transport mean free path of the photon. The absorption coefficient, reduced scattering coefficient and the phase function parameter γ=(1−g2)/(1−g1) are optical parameters computed from a single measurement of the spatially resolved reflectance close to the source. Images of superficial structures of the medium can be obtained by performing multi-site measurements. An important application of this technique is the characterization of biological tissues, for example for medical diagnostic purposes. Measurements on biological tissues can be achieved using a probe of diameter less than 2 mm, and the average volume probed is on the order of 1 mm3. Separate images of absorption and tissue structure can be achieved with a resolution of approximately one transport mean free path of the considered tissue.

REFERENCES:
patent: 5284137 (1994-02-01), Kessler et al.
patent: 5353790 (1994-10-01), Jacques et al.
patent: 5441054 (1995-08-01), Tsuchiya
patent: 5452723 (1995-09-01), Wu et al.
patent: 5517987 (1996-05-01), Tsuchiya
patent: 5630423 (1997-05-01), Wang et al.
patent: 5645061 (1997-07-01), Kessler et al.
patent: 5676142 (1997-10-01), Miwa et al.
Bevilacqua et al, “In vivo local determination of tissue optical properties”, SPIE, European Biomedical Optics, Bios Europe 97, vol. 3194, 1997, pp. 262-268.
Marquet et al, “Determination of Reduced Scattering and Absorption Coefficients by a Single Charge-Coupled-Device Array Measurement. Part I: comparison between experiments and simulations”, Optical Engineering, vol. 34, No. 7, Jul. 1995, pp. 2055-2063.
Wyman et al, “Similarity relations for the interaction parameters in radiation transport”, Applied Optics, vol., 28, No. 24, Dec. 15, 1989, pp. 5243-5429.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Method and apparatus for measuring locally and superficially... does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Method and apparatus for measuring locally and superficially..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring locally and superficially... will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-3452033

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.