Method and apparatus for measuring localized temperatures and vo

Details Method and apparatus for measuring localized temperatures and vo Method and apparatus for measuring localized temperatures and vo

1996-08-30

1998-08-18

Gutierrez, Diego F.F.

Thermal measuring and testing

Temperature measurement

By electrical or magnetic heat sensor

374141, G01K 700, G01K 1300

Patent

active

057950687

ABSTRACT:
A method is described for measuring localized operating temperatures and voltages on an integrated circuit. The integrated circuit includes an oscillator circuit with a frequency that varies with temperature and/or applied voltage. The frequency of the oscillator is then determined, using a constant voltage, for a number of temperatures to establish a known relationship between oscillation frequency and temperature. Once the relationship is known, a similar oscillator is included within or adjacent a second circuit of the integrated circuit. The operating temperature or operating voltage of the second circuit may then be determined by monitoring the frequency of the oscillator while the second circuit is operational.

REFERENCES:
patent: 4210024 (1980-07-01), Ishiwatari et al.
patent: 4493565 (1985-01-01), Saka
patent: 4551031 (1985-11-01), Ishikawa et al.
patent: 4658407 (1987-04-01), Iwama
patent: 5388134 (1995-02-01), Douglas et al.
"The Programmable Logic Data Book," Chapters 7 and 8 (1994), Xilinx, San Jose, California.

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