Method and apparatus for measuring jitter

Details Method and apparatus for measuring jitter Method and apparatus for measuring jitter

2006-02-21

2006-02-21

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Parameter related to the reproduction or fidelity of a...

C324S613000, C702S069000

Reexamination Certificate

active

07002358

ABSTRACT:
A method of measuring jitter includes generating a jitter pulse having a width corresponding to an amount of jitter. The jitter pulse is provided to a plurality (M) of latches serially coupled to successively trim the pulse as it propagates through the serially coupled latches. Each latch, li, provides an output biindicative of receipt of an edge of the jitter pulse.

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Kuo-Hsing Cheng, et al., “Bist for Clock Jitter Measurements”, Proceedings of the 2003 IEEE International Symposium on Circuits and Systems, May 25, 2003, vol. 5, pp. V-577-V580, IEEE, Piscataway, New Jersey, USA.
Institut National De La Propriete Industrielle, cover sheet and Preliminary search report dated Jul. 13, 2005 for counterpart French patent application 0413117 (3 pgs).

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