Method and apparatus for measuring high speed glitch energy...

Details Method and apparatus for measuring high speed glitch energy... Method and apparatus for measuring high speed glitch energy...

2006-07-25

2006-07-25

Deb, Anjan (Department: 2858)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Parameter related to the reproduction or fidelity of a...

C370S201000, C716S030000

Reexamination Certificate

active

07081762

ABSTRACT:
A method and apparatus are provided for measuring high speed glitch energy between first and second. The method and apparatus induce a change in charge on the first node from a first charge level to a second charge level with glitch energy supplied by the second node. An amount of charge is then supplied to the first node to restore the charge on the first node from the second charge level toward the first charge level. A representation of the amount of charge supplied to the first node is measured.

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Bastos et al., “A 12-Bit Intrinsic Accuracy High-Speed CMOS DAC”, IEEE Journal of Solid-State Circuits, vol. 33, No. 12, Dec. 1998; p. 1959-1969.

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