Method and apparatus for measuring high speed glitch energy...

Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...

Reexamination Certificate

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C370S201000, C716S030000

Reexamination Certificate

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07081762

ABSTRACT:
A method and apparatus are provided for measuring high speed glitch energy between first and second. The method and apparatus induce a change in charge on the first node from a first charge level to a second charge level with glitch energy supplied by the second node. An amount of charge is then supplied to the first node to restore the charge on the first node from the second charge level toward the first charge level. A representation of the amount of charge supplied to the first node is measured.

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Bastos et al., “A 12-Bit Intrinsic Accuracy High-Speed CMOS DAC”, IEEE Journal of Solid-State Circuits, vol. 33, No. 12, Dec. 1998; p. 1959-1969.

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