Electricity: measuring and testing – Of geophysical surface or subsurface in situ – Using electrode arrays – circuits – structure – or supports
Reexamination Certificate
2007-04-10
2007-04-10
Lefkowitz, Edward (Department: 2862)
Electricity: measuring and testing
Of geophysical surface or subsurface in situ
Using electrode arrays, circuits, structure, or supports
C324S370000
Reexamination Certificate
active
10912588
ABSTRACT:
A method is disclosed for determining spatial distribution of resistivity of Earth formations surrounding a wellbore having a conductive pipe therein. The method includes measuring resistivity of the Earth formations using measurements of current leakage along the pipe at selected axial positions. Electromagnetic properties of the Earth formations are measured from within the pipe. The measurements of electromagnetic properties correspond to a larger axial distance and to a greater lateral distance than the measurements of resistivity from current leakage. The current leakage and electromagnetic measurements are jointly inverted to obtain a model of the spatial distribution.
REFERENCES:
patent: 2459196 (1949-01-01), Stewart
patent: 2729784 (1956-01-01), Fearon
patent: 2891215 (1959-06-01), Fearon
patent: 4796186 (1989-01-01), Kaufman
patent: 4820989 (1989-04-01), Vail, III
patent: 4837518 (1989-06-01), Gard et al.
patent: 4882542 (1989-11-01), Vail, III
patent: 5043668 (1991-08-01), Vail, III
patent: 5075626 (1991-12-01), Vail, III
patent: 5223794 (1993-06-01), Vail, III
patent: 5510712 (1996-04-01), Sezginer et al.
patent: 5543715 (1996-08-01), Singer et al.
patent: 5563514 (1996-10-01), Moulin
patent: 5570024 (1996-10-01), Vail, III
patent: 5608323 (1997-03-01), Koelman
patent: 5633590 (1997-05-01), Vail, III
patent: 5654639 (1997-08-01), Locatelli et al.
patent: 5680049 (1997-10-01), Gissler et al.
patent: 5809458 (1998-09-01), Tamarchenko
patent: 6025721 (2000-02-01), Vail, III
patent: 6157195 (2000-12-01), Vail, III
patent: 6246240 (2001-06-01), Vail, III
patent: 6603314 (2003-08-01), Kostelnicek et al.
patent: 6667621 (2003-12-01), Benimeli
patent: 2001/0033164 (2001-10-01), Vinegar et al.
patent: 2001/0038287 (2001-11-01), Amini
patent: 2002/0105333 (2002-08-01), Amini
patent: 2003/0042016 (2003-03-01), Vinegar et al.
patent: 2003/0184299 (2003-10-01), Strack
patent: 2005/0264295 (2005-12-01), Strack et al.
Rueter Horst
Strack Kurt M.
Fagin Richard A.
KJT Enterprises, Inc.
Schindler David M.
LandOfFree
Method and apparatus for measuring formation conductivities... does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Method and apparatus for measuring formation conductivities..., we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Method and apparatus for measuring formation conductivities... will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3756816