Method and apparatus for measuring effective focal spot...

Details Method and apparatus for measuring effective focal spot... Method and apparatus for measuring effective focal spot...

2007-07-31

2007-07-31

Song, Hoon (Department: 2882)

X-ray or gamma ray systems or devices

Accessory

Testing or calibration

C378S113000

Reexamination Certificate

active

11443239

ABSTRACT:
A method for measuring focal spot shape of a radiation beam from a radiation source includes collimating the radiation beam using a collimator having a well-defined edge, measuring an intensity profile of the collimated radiation beam, determining a function of the measured intensity profile, and determining a metric of the of the focal spot using the determined function of the measured intensity profile.

REFERENCES:
patent: 4442539 (1984-04-01), Aichinger et al.
patent: 5606591 (1997-02-01), Montel et al.
patent: 5872830 (1999-02-01), Herrndorf
patent: 6233348 (2001-05-01), Fujii et al.
patent: 6327331 (2001-12-01), Toth et al.
patent: 2002/0159566 (2002-10-01), Popescu
Everson, Gray “Focal-Spot Measurement: Comparison of slit, Pinhole, and Star Resolution Pattern Techniques” Rad. 165, 261 (1987).

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