Method and apparatus for measuring die-level integrated...

Details Method and apparatus for measuring die-level integrated... Method and apparatus for measuring die-level integrated...

2006-02-15

2008-10-14

Nguyen, Ha (Department: 2829)

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

Reexamination Certificate

active

07436196

ABSTRACT:
A system that determines power consumption on an IC chip. The system includes a test structure located within the IC chip variations which includes one or more gates which receives power from a power source, wherein each gate has a different drive strength, and wherein the output of each gate is coupled to a load through a corresponding switch. The system also includes a current-measuring mechanism coupled to the power supply which measures the current consumed by the gates. When a specific switch is activated, the output of a corresponding gate is coupled to the load, thereby causing the corresponding gate to drive the load. The current consumed by the corresponding gate is measured by the current measuring mechanism. The measured current can be used to determine the power consumption of the corresponding gate driving the load.

REFERENCES:
patent: 5793126 (1998-08-01), Gray
patent: 5864506 (1999-01-01), Arcoleo et al.
patent: 2001/0013790 (2001-08-01), Kusumoto
patent: 2004/0066209 (2004-04-01), Beer et al.
patent: 2004/0179624 (2004-09-01), Deas et al.
patent: 2005/0093561 (2005-05-01), Watanabe et al.

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